Philips_PM6507_Transistor_Curve-Tracer 电路图.pdf

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1、HILIPS RadioFans.CN 收音机爱 好者资料库 ttC-, iy I . A A A - PHILIPS TRANSISTOR CURVE-TRACER PM 6507 9452 065 07. t 9499 520 04511 1/469/1/04 Manual RadioFans.CN 收音机爱 好者资料库 2 CONTENTS GENERAL I. INTRODUCTION 7 II. WORKING PRINCIPLE 7 III. BLOCK DIAGRAM 8 1. Control section 8 2. Display section i2 IV. TECHNIC

2、AL DATA 13 V. ACCESSORIES 15 DIRECTIONS FOR USE VI. INSTALLATION 17 A. Adjustment to the local mains voltage 17 B. Earthing 17 C. Connection to the mains 17 D. Rack mounting version 18 VII. OPERATING INSTRUCTIONS 19 A. Survey of the controls 19 B. Hints for testing semi-conductors 19 C. Functions of

3、 the controls 19 D. Operation 23 1. Basic setting 23 2. Switching-on the apparatus 23 3. Connection of asemi-conductor 23 4. Adjusting the display section 23 5. Setting for testing semi-conductors with 3 or 4 terminals 23 6. Setting for breakdown tests of diodes and other elements with 2 connections

4、 26 7. Setting for external control or programming 27 SERVICE DATA VIII. CIRCUIT DESCRIPTION 37 A. Supply section 37 ,_, 1. Mains supply 37 2. Collector voltage supply 37 3. H.T. supply 37 4. Direct voltage source +31.51 +300 x-30 V 37 B. Step generator 39 1. Phase shifter, amplifier and rectifier,

5、pulse shaper 39 2. Duty cycle 39 , 3. Ring counter 39 4. Amplifier 43 5. Power amplifier 44 C. Display section 44 1. Circuit for I, and V, l; measurements 45 2. Circuit for Vi;l.; measurements 46 3. Circuit for breakdown voltage and leakage current measurements 47 ,_ 4. Difference amplifier for X an

6、d Y-deflection 48 5. Output amplifiers for X and Y-deflection 48 6. Brightness control 48 IX. DISASSEMBLY 49 A. Cabinet 49 B. C.R.T. 49 RadioFans.CN 收音机爱 好者资料库 3 C. Removing the subunits D. Removing components X. MAINTENANCE XI. SURVEY OF ADJUSTING ELEMENTS XII. CHECKING AND ADJUSTING A. Direct volt

7、ages -x-30 V and 30 V B. EHT unit 4.5 kV C. 3 kV voltage for testing diodes D. Step generator E. Collector voltage supply F. Monitor XIII. THE SHIPMENT OF THE INSTRUMENT 52 57 61 62 63 63 64 64 64 64 65 67 XIV. LISTS OF PARTS 68 4 LIST OF FIGURES 1 2 3 4 5 Basic construction Block diagram Accessorie

8、s Rear side of the instrument Making the instrument suitable fora 19 rack 6 10 15 17 18 6 7 Basic considerations for testing semi-conductors 19 8 9 Front view with controls and sockets 20 10 Trigger point 20 11 Effect of the duty-cycle control 24 12 Curve display with current limiting 24 13 Breakdow

9、n characteristics 25 14 Compensation for the rion-linear part of the base-emitter diode characteristic 25 15 I-V aow m s r u d W Na a e m a _ _+_ _- E Fig. 2. Block diagram 12 whereby 3 voltage measuring ranges are available which can be reduced by a factor 10 with push- button x.1, as well as sever

10、al switchable ranges ._ for uA and nA measurements. Push-button Read connects the H.T. circuit only when it is closed manually or by means of a pro- tection device. 2. Voltage source for fourth electrode Connection socket S on the transistor holder, apart from earthing the transistor case (e.g. with

11、 ._, H.F. transistors), may also serve for connecting e.g. a second gate in case of field effect transis- tors. For this a variable direct voltage of max. 10 V can be applied (Shield Voltage), whose polarity can be selected by means of a switch. 2. Display section The display section of the curve tr

12、acer does not affect . the working of the other sections. After having passed the relevant circuits and after being amplified the vol- tage or current changes occuring in the transistor are displayed on the c.r.t. Two step-switches serve for range selection and mode selection for the horizontal and

13、vertical deflection. The horizontal deflection comprises 12 collector vol- tage ranges, 4 base voltage measuring ranges, one step range position, 3 ranges for diode test voltages and position EXT for external control. By means of the step switch for the vertical deflection the collector current rang

14、e is selected in 18 steps, s whereby the sensitivity of 10 steps can be increased by a factor 103 for measuring diode leakage currents. Moreover, the base voltage measuring sensitivity can be adjusted in 4 steps by means of this switch and an additional position is available for external control. By

15、 means of a slide switch all vertical deflection ranges can be extended to either side by a factor 0.5 and 5. To enable proper curve display in case of an inverted signal, a switch has been provided by means of which the polarity of the horizontal and vertical deflection voltages can be reversed. Th

16、is switch also serves for switching on the calibration voltage (CAL). The voltages present on the semi-conductor (or the current relations) are not influenced by the display section. Therefore the operating voltages for the semiconduc- tor under test are applied to the differential amplifiers via hi

17、gh-ohmic input stages. The output amplifiers supply the power required for the magnetic deflection, whereby the trace can be shifted in the horizontal and the vertical direction by means of the combined coarse and fine controls. The acceleration voltage for the picture tube is delive- red by a 4.5 k

18、V generator. In order to keep the brightness of the picture constant at different sweep speeds a brightness modulator has been provided which increases the intensity at the higher speeds. The brightness of the picture is also influenced by control Duty Cycle. 13 IV. Technical data Tolerances: Numeri

19、cal values with statement of tole- rances are guaranteed by the factory. Data without tolerances serve merely for information and represent the properties of an average apparatus. Step generator _, Step current generator: , Current steps (constant current values) Number of curves Stability of the st

20、ep spacings Stability of the current generator Step voltage generator: Voltage steps mV/step max. internal resistance 2: (current per step 200 mA) Switchable source resistors Duty cycle Zero adjustment of the step voltage 1, 2, 5A etc .200 mA/step (17 steps plus a 0 -step) All current steps can be d

21、oubled for a brief period 7 (8 with datum line) adjustable from 2 . . 8 Between the first and seventh step within an arbitrary range 1 %; with respect to each other: in all ranges 3 A load variation of 0.1 V at 1 V causes an error of 1 % in all ranges 0 20 50 100 200 500 1000 0.1 0.1 0.25 .5 1 2.5 5

22、 All voltage steps can be doubled for a brief period steps: 0, 1, 2, 5 4 etc . . 10 MQ (23 steps) at 100 pulses/sec. 250 sus . . . 6 ms (2.5%.60%and 100% at 200 pulses/sec. the same pulse times apply, however, twice the duty cycle in percentages. Overlap from 4 ms. Can be shifted 100 % (7 steps) in

23、the positive or negative direction (at 200 mA/step and all mV/step ranges max. 12 V at 30 %duty cycle). Collector supply Rectified sine-wave voltage, continuously adjustable in 4 ranges Voltage range Max. current Internal resistance Ri (at 220 V) 0 . . . 10 VP _ 20 A 0.3 2 0. . 50Vp_, 4 A 3.8 S2 0.1

24、00VP_u 2 A 16 S? 0.500 V, _ u 0.2 A 400 52 Polarity Overload protection Current limitation Connection sockets BU2B Diode voltage source Voltage range Maximum load current Short circuit current ., Internal resistance Voltage sourcefor 4th electrode Reversible by means of button PNP-NPN By means of th

25、ermo-magnetic switch. Response time at 2x the nominal current: approx. 15 secs. Response time at 10 x nominal current: 0.05 secs. at max. By means of switchable series resistors. Resistance scale: 0, 0.1, 0.2, 0.5 2 etc . . .100 k 10 % (20 steps) provided with Kelvin take-offs when adapter PM6549A i

26、s used. (continuously adjustable half-wave voltage) 0.3000 V _ 1 mA 8 mA, _ at max. 370 kS? 0 . 10 V; continuously adjustable from 0 to + or 10 V Connection to the S socket 14 Display section C.r.t. :Type AW 17/69, flat screen 10 x 12 cm magnetic deflection, electrical focussing. 4.5 kV acceleration

27、 voltage Beam current intensity Externally adjustable, moreover automatic brightness modulation depending on duty cycle and sweep speed. Lattice illumination :continuously adjustable Y-deflection :Collector current 10 - 20 - 50 A/cm . . 5 A/cm (18 steps) Diode current 10 - 20 - 50 nA/cm . . 10 A/cm

28、(10 steps) . Step function 1 step/cm (step adjustment according to step selector) V; ranges 20 - 50 - 100 - 200 mV/cm Expansion switch :All deflection ranges can be extended by a factor .5 or 5. _ External deflection coefficient: 10 mV/cm (5 mV or 50 mV/cm) Polarity of the deflection: reversible Shi

29、ft range: 10 times the screen height with coarse-fine control X-deflection :Collector voltage 10 - 20 - 50 mV/cm . . . 50 V/cm (12 steps) Diode voltage :100 - 200 - 500 V/cm 10 times reduction possible with switch x.1 Step function 1 step/cm (step adjustment according to step selector) V,;,; ranges

30、10 - 20 - 50 - 100 mV/cm External deflection coefficient: 10 mV/cm Deflection polarity :reversible Shift range 10 times screen width with coarse fine control External input :Symmetrical 10 mV/cm - Input resistance *) :1,000 mS?, at Y2/X1/X2 internally shunted with 1 MS? Drive voltage max. 1 VP_n Max

31、imum permissible input voltage: 100 V d.c. (short-term) Maximum permissible common mode voltage: - 8 V_I, External connection facility for Z-modulation Datum line adjustment _. External step signal programming Auxiliary voltage: + 30 V Calibration :Calibration voltage: 50 mV 0.5 causing a deflection

32、 of 5 cm (horizontal and vertical) Mains supply Mains voltages 115 V and 230 V 15 Frequency: 40.60 Hz; also suited for 400 Hz Power consumption approx. 50 VA at normal load approx. 250 VA at max. load Inaccuracy Measuring resistors 1 Indication: 3 % for a field of 8x10 cm Ambient temperature +10 . .

33、 +35C without any adverse effect ,_ 10 . . -50C additional error of 2 20 . -I-60C operational at reduced power Mechanical data :Dimensions :Height 22 cm Width 45 cm Depth 32 cm Weight 21 kg * The MQ shunt resistors (R362, R363, R426) can be removed. 15 V. Accessories - t Mains cable 2 Transistor ada

34、pters PM 6549 (for L.F. and power transistors) 1 Manual Optional accessories: Transistor adapter PM 6544 for power transistors (case SOT9; DIN 9A2) Transistor adapter PM 6547 (for RF transistors) Transistor adapter PM 6548 (empty case for mounting special holders) Transistor adapter PM 6549A (for po

35、wer transistors, with Kelvin take-offs) Diode adapter PM 6546 Polaroid camera assy PM 9380 Camera adapter PM 9377 Supplementary Cense PM 9373 PM 6547 Fig. 3. Accessories PM 6548 PM 6549 PM 6544 PM 8549A 17 DIRECTIONS FOR USE . Vl. Installation A. ADJUSTMENT TO THE LOCAL MAINS VOLTAGE - At the rear o

36、f the apparatus (Fig. 3) a voltage adapter has been fitted by means of which the apparatus can be adjusted to the local mains voltage. The apparatus can be adapted to 2 mains voltages, i.e. 115 V - 15 and230V-j-15%. Fuses VL1 and VL2: for 230 V:1 A (delayed action type) for 115 V:2 A (delayed action

37、 type) The 2A-fuses are situated in the two holders shown in fig. 4. B. EARTHING The apparatus should be earthed in accordance with the local safety regulations. _ This may be effected: Via the accessory 3-core mains cable, provided that this is connected to a mains socket with rim earthing. Via the

38、 earthing screw at the rear of the apparatus. C. CONNECTION TO THE MAINS Before connecting the unit check that the voltage adapter is set to the correct position. Connect the apparatus to the mains (check earthing) and switch it on by means of mains switch POWER The pilot lamp above the switch shoul

39、d light up. Fig. 4. Rear side of the instrument 18 D. RACK-MOUNTING VERSION The dimensions of the transistor curve tracer permit of _. mounting the instrument into a 19 rack. For this purpose a cornerpiece should be fitted on each side. These pieces are already present in the instrument. For convert

40、ing the instrument proceed as follows: . Remove the two side plates (4 screws each). Remove the 4 feet. The cornerpieces have been mounted on each side by means of 2 screws A (Fig. 5). Remove these i A A A ., A A A t 1 Fig. 5. Making the instrument suitable fora 19 rack screws, take out the cornerpi

41、eces and refit the screws. Remove the frontmost screws B and fit the corner- pieces by means of these screws. Refit the side plates. When mounting the instrument ensure that the air cir- culation is not impeded. Especially make sure that the instrument is not placed close to an apparatus giving off

42、much heat (observe max. ambient temperature!). 19 V11. Operating instructions A A A A A A R A A A A A A n A ATTENTION: The collector supply source permits adjustment of vol- tages up to 500 V,.;,i; with respect to earth. At the high tension output this is even as high as 3000 V,.;,; with respect to

43、earth. Voltages exceeding 34 V,.;,; may be lethal. When inserting the semi-conductor under test into the sockets or adapter, switch SK18 should always be in position OFF! The semi-conductor connection is then interrupted at three points. The utmost of care should be taken when working with high supp

44、ly voltages. For testing diodes with the aid of the high-tension source, it is advisable to use the special adapter PM 6546, described in this manual. A. SURVEY OF THE CONTROLS see Fig. 9 B. HINTS FOR TESTING SEMI-CONDUCTORS In practice it often appears that certain problems in measuring semi-conduc

45、tors are due to misjudgement of the semi-conductor under test. In this chapter the most essential points are given which must be obser- ved when testing asemi-conductor. First consideration: To which type belongs the semi- conductor to be tested? Diode - Thyristor - PNP - or NPN transistor, Power, R

46、.F. or L.F. transistor, Field effect transistor, etc. Before connecting the transistor or diode to be tested it is necessary to establish type and power rating. Fig. 6 Second consideration: What points should be checked? Short-circuit, leakage current, breakdown voltage, cur- rent gain, characterist

47、ics of a certain function etc. The best method is to effect the measurement accor- ding to a definite testing procedure, especially with types whose characteristics are not known and which consequently may show deviations from the pre-set values. Fig. 7 Third consideration: Which is the max. power l

48、imit of the semi-conductor under test; which are the maximum permissible voltages and currents? This point is very important, because especially in tes- ting semi-conductors it may occur that the maximum permissible values are exceeded and the semiconduc- tor under test is damaged. In this respect, however, the curve tracer offers the possibility to display the cha- racteristics at extreme values without overloading the semi-conductor. The relevant instructions are given under point D 5.1.1-5. Fig. 8 Basic considerations for testing semi-conductors C. FUNCTIONS OF THE CONTROLS The indica